EDX 3000 PLUS: accurate and non-destructive analysis of precious metals
The EDX 3000 PLUS from Skyray is an X-ray fluorescence (XRF) precious metal analyser specifically designed to meet the needs of professionals in the jewellery, precious metal manufacturing, recovery and quality control industries. Thanks to its non-destructive analysis technology, it can quickly and accurately determine the composition of gold, platinum, silver, palladium and secondary metals such as copper, zinc and nickel.
The device is based on an SDD detector with a 25 mm² beryllium window, allowing optimal capture of the X-rays emitted by the sample. This configuration significantly improves measurement accuracy, particularly for elements such as iridium in platinum, while complying with the international standards of GB/T 18043-2000.
The EDX 3000 PLUS stands out for its energy resolution of 139 ± 5 eV, which surpasses the performance of traditional Si-PIN detectors, offering better ability to discriminate spectral peaks and therefore better analytical accuracy. It incorporates digital multi-channel analysis technology, coupled with a counting capacity of up to 80,000 pulses per second. This represents a 5- to 10-fold improvement in processing speed compared to standard detectors, while doubling or even quadrupling measurement accuracy.
The integrated HD CMOS camera allows precise positioning of the sample on the mobile platform, ensuring consistency between tests. Thanks to the single-button interface, analysis is quick and intuitive. The device automatically applies the basic parameters for selecting calibration curves, making it accessible even to non-expert users.
Its robust design, with dimensions of 550 x 410 x 320 mm and a weight of 45 kg, makes it a reliable tool for use in laboratories or industrial environments. It operates optimally at ambient temperatures between 15 and 30°C. To ensure voltage stability, the use of a purified and stabilised power supply is recommended.
